TEXTURE SEGMENTATION AND SHAPE CLASSIFICATION WITH HISTOGRAM TECHNIQUES
AND SELF-ORGANIZING MAPS
Jukka Iivarinen Acta Polytechnica Scandinavica, Mathematics, Computing and Management in Engineering Series No. 95, Doctor of Science (Technology) Thesis, Espoo 1998.
Abstract
High speed requirements of a web inspection system limit the
number of techniques that can be applied, and the design is often
a compromise between the recognition power and the computational
complexity.
The main contribution of the thesis is the development of fast
techniques for defect detection and classification that can satisfy
the high speed requirements and that can be applied in a real web
inspection system.
A new self-organizing map (SOM) variant, the statistical SOM, is
proposed for defect detection. It is a fast and simple classifier
that can be implemented efficiently in hardware.
In addition to a fast classifier, fast feature extraction
techniques are also needed. One such group of techniques is called
histogram techniques.
They have been popular in surface inspection applications as they
are relatively simple and fast to compute and yet they have a reasonable
performance. Histogram techniques and the SOM in texture analysis, in
shape analysis, and in surface inspection are reviewed in the
introductory part of the thesis. In the publications these methods
have been applied e.g. in paper web inspection.
The developed defect detection scheme offers several improvements over the
gray-level thresholding technique that has been traditionally used
in commercial web inspection systems.
Furthermore, it has been
implemented in hardware that is suitable and fast enough to be
included in a working web inspection system.
The developed defect classification scheme has several features
that have not been implemented in web inspection before.
The proposed shape and texture features make it possible to do
better and more accurate defect classifications.
The codebook-based classifier allows addition of new defects into
the codebooks continuously. Thus information on different defects
can be collected into the classification system over a long
period.
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