SURFACE DEFECT DETECTION WITH HISTOGRAM-BASED TEXTURE FEATURES
Jukka Iivarinen
In D. P. Casasent (Ed.),
Intelligent Robots and Computer Vision XIX: Algorithms,
Techniques, and Active Vision, Proc. SPIE 4197, pages 140-145, 2000.
Abstract
In this paper the performance of two histogram-based texture analysis
techniques for surface defect detection is evaluated.
These techniques are the co-occurrence matrix method and the local
binary pattern method.
Both methods yield a set of texture features that are computed from
a small image window.
The unsupervised segmentation procedure is used in the experiments.
It is based on the statistical self-organizing map algorithm that is
trained only with fault-free surface samples.
Results of experiments with both feature sets are good and there is no
clear difference in their performances. The differences are found in
their computational requirements where the features of the local
binary pattern method are better in several aspects.
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